【摘要】 应力差分反射术是一种调制光谱技术． 它的测量机理是对半导体材料施加一非均匀的应力，使材料的介电函数发生改变，从而产生与材料的光学跃迁相联系的 Ｄ Ｒ 信号，实现调制的目的． 实验结果表明，应力差分反射光谱能够较好地指认均匀性较好的材料的量子化跃迁更多还原

【Abstract】 Stress Differential Reflectance (SDR) technique is a modulated technique for measuring the bulk materials with good homogeneities. The dielectric functions of semiconductor materials are changed by giving a inhomogeneous stress to the sample.DR signals relating to optical transition of the materials are resulted from inhomogeneous stress. The experiment demonstrates that SDR spectrum can easily define the quantized transition of the bulk materials with good homogeneities.更多还原