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细丝直径测量的双光束干涉法

Double-beam Interferometric Method to MeasureThin Wire Diameter

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【作者】 高伟; 吴卫民; 孙晓红; 吴云霞; 白明; 明海; 谢建平;

【Author】 Cao Wei ;Wu Weimin ;Sun Xiaohong ;Wu YunkiaBai Ming; Ming Hai ;Xie Jianping(Department of Physics, Univelsity of Science and Technology of China Hefei 230026 )

【机构】 芜湖师范专科学校物理系!安徽芜湖; 241008; 中国科学技术大学物理系!合肥230026; 中国科学?;

【摘要】 本文提出一种双光束干涉法测量细丝直径的方法.两束平行光波相向入射到细丝上,反射后形成两条虚线源,它们产生平直的条纹,条纹周期与丝径成反比.由CCD摄取条纹图进入微机处理,给出细丝直径。文中将介绍该方法的原理和装置,给出相应的实验结果,并对其应用前景作简要的讨论.

【Abstract】 A double-beam interferometric method to measure thin wire diameteris proposed in the present paper. Two plane light waves incidence upon the thinwire, two imaginary lines produced in light reflection can interference to give theparallel fringes, whose spatial period is proportional to the observation distance andinverse to the thin wire diameter. In this paper, we will explain the principle of thismethod and describe the experimental set-up in section 2. The experimental resultsare given in section 3. As well, a brief discussion about its application potential inthe concltlsion.

  • 【文献出处】 量子电子学报 ,CHINESE JOURNAL OF QUANTUM ELECTRONICS , 编辑部邮箱 ,1999年03期
  • 【分类号】TH744.3
  • 【被引频次】5
  • 【下载频次】672
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