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扫描近场光学显微镜及其初步应用

Scanning Near-field Optical Microscope and Application

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【作者】 刘秀梅王佳李达成

【Author】 Liu Xiumei; Wang Jia; Li Dacheng(State Key Laboratory of Precision Measurement Technology and Instrument,Tisinghua University, Beijing 100084)

【机构】 清华大学精密仪器系精密测试技术及仪器国家重点实验室!北京100084

【摘要】 介绍的扫描近场光学显微镜能够以探针作为亚微米光源或探测器以及受抑全反射等三种工作方式探测样品,在没有样品一探针间距控制的情况下对全息光栅、脂质体以及沸石粉末等进行了扫描成像,并获得了超衍射极限的光学分辨率,其中最优分辨率可达约100nm。

【Abstract】 The scanning near-field optical microscope (SNOM) breaks the diffraction limitof the conventional optical microscope. It has promising applications in the fields of materialscience, bioiogical engineering, and semiconductor physics, say a few. A versatile SNOM,which can operate in illumination mode, collection mode and frustration total internalreflection (TIR) mode, was developed. Several kinds of samples including holographicgrating, liposome and powder of BaCO3 were investigated. Images with an optical resolutionof 100 nm were obtained.

【基金】 国家自然科学基金!39470204
  • 【文献出处】 中国激光 ,CHINESE JOURNAL OF LASERS , 编辑部邮箱 ,1999年09期
  • 【分类号】TH74
  • 【被引频次】11
  • 【下载频次】583
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