【摘要】 对铁电薄膜的开关特性进行了分析．介绍了利用美国ＨＰ４１９２Ａ低频阻抗分析仪设计铁电薄膜开关特性测量仪的方法．讨论了测量原理以及如何利用测量仪所产生的双极性双脉冲对铁电薄膜的开关特性进行测量，给出了有关ＰＺＴ（５５／４５）铁电薄膜样品的测量结果更多还原

【Abstract】 The switching characteristics of ferroelectric thin films are analyzed. The ways and means are described utilizing American HP4192A LF Impedance Analyzer to design a measuring instrument of switching characteristics with ferroelectric thin film. The measuring principle and the use of bipolar double pulse generated by measuring instrument for measuring switching characteristics with ferroelectric thin films are discussed. Measurement result of the samples of PZT(55/45) ferroelectric thin films is given.更多还原