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用Z扫描法测量a-Si/SiO2多量子阱材料非线性折射率
Measurement of the Nonlinearities of a Si/SiO2 MQW with Z scan Method
【摘要】 利用Ｚ扫描法和波长为０．５３ μｍ 、脉宽为１０ ｎｓ的调Ｑ－Ｎｄ∶ＹＡＧ激光器测量了ａ－Ｓｉ／ＳｉＯ２ 多量子阱材料的三阶非线性折射率。并对该材料光学非线性的产生机理作了探讨
【Abstract】 The third order nonlinerities of a Si/SiO 2 MQW were studied by Z scan technique with 10 ns,0.5 μm pulses from a Q switched Nd∶YAG laser.The experimental results that nonlinear refractivity of a Si/SiO 2 MQW is 1.513×10 -15 (m 2/W).The nonlinear machanism of the material were discussed in terms of the quantum confined effect.
【基金】 国家自然科学重大基金
- 【文献出处】 光电子·激光 ,Journal of Optoelectronics.laser , 编辑部邮箱 ,1999年05期
- 【分类号】O472.3
- 【被引频次】4
- 【下载频次】125