【摘要】 扫描近场光学显微镜（ＳＮＯＭ）打破了传统光学显微镜的衍射极限分辨率，自８０年代中期出现以来在１０多年的时间内获得了迅速的发展，并在很多的领域有很广阔的应用前景。扫描探针的形状及针尖的大小是影响ＳＮＯＭ分辨率的关键因素之一。本文利用自己设计的实验装置提出一种制备探针的新颖热拉法，并将热拉法和腐蚀法相结合，大大提高了实验的成功率。两种方法获得的针尖最优尺寸分别可达９６ｎｍ和７６ｎｍ。更多还原

【Abstract】 The scanning near field optical microscope breaks the resolution of the diffraction limit of the conventional optical microscope.Since mid 1980s,it has achieved rapid development in the past over 10 years.It has a broad application prospect in many fields.The shape and size of the scanning probe tip are the key factors in affecting the resolution of the scanning near field optical microscope.A novel hot drawing method for making probe is put forward by using the self designed experimental setup.The successful rate in experiments has been greatly raised by the combination of the hot drawing method and chemical etching method.The optimal sizes of the probe tips obtained with two methods have reached 96nm and 76nm,respectively.更多还原