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低温下分子束外延生长GaAs的光致发光研究

PHOTOLUMINESCENCE STUDY ON MBE LOW TEMPERATURE GROWN GaAs

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【作者】 江德生吕振东崔丽秋周向前孙宝权徐仲英

【Author】 Jiang Desheng Lu Zhendong Cui Liqiu Zhou Xiangqian Sun Baoquan Xu Zhongying (National Laboratory for Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083)

【机构】 中国科学院半导体研究所超晶格国家重点实验室

【摘要】 研究了低温下分子束外延生长GaAs(LTG-GaAs)样品的稳态和瞬态发光.从200℃生长的样品中可测到很弱但清晰可辨的稳态发光峰,峰的能量位置相对于体GaAs激子峰有一定蓝移.此外,发现在体GaAs上生长LTG-GaAs薄膜可大大减小体GaAs衬底材料中本征发光的衰减时间,但对(e,A°)发光影响不大.用上转换方法对退火和未退火LTG-GaAs样品瞬态发光进行了测量,获得了关于LTG-GaAs中复合中心和陷阱中心的信息.

【Abstract】 The steady state and transient photoluminescence (PL) of molecular beam epitaxial (MBE) low temperature grown (LTG) GaAs samples are investigated. A weak but well distinguished steady state PL peak is detected from LTG GaAs.Its peak energy has a blue shift relative to the excitonic PL peak of bulk GaAs. Furthermore, it is confirmed that the decay time of the intrinsic luminescence from bulk GaAs substrate is strongly reduced by the top LTG GaAs layer, while no essential change occurs for the impurity related (e, A°) luminescence. The transient PL of LTG GaAs without and after annealing is measured by using up conversion technique. The information about recombination and trapping centers are obtained.

【关键词】 光致发光砷化镓分子束外延瞬态测量
【Key words】 photoluminescenceGaAsMBEtransient measurement
  • 【文献出处】 发光学报 ,CHINESE JOURNAL OF LUMINESCENCE , 编辑部邮箱 ,1999年01期
  • 【分类号】O734.3,O734.3
  • 【下载频次】139
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