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Au/a-Ge膜退火行为的多重分形研究

Study of multifractal spectrum of annealed Au/a\|Ge bilayer films

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【作者】 王晓平陈志文张庶元吴自勤

【Author】 WANG Xiao\|ping 1,2 \ CHEN Zhi\|wen 3\ ZHANG Shu\|yuan 3\ WU Zi\|qin 2 (1 Physics Department,2 Fundamental Physics Center,3 Structure Research Laboratory,University of Science and Technology of China,Hefei 230026,China.)

【机构】 中国科学技术大学物理系!基础物理中心结构分析开放研究实验室!合肥230026

【摘要】 研究了Au/a-Ge 双层膜退火后形成分形花样的分布及其分维。单个分形枝叉的疏密可用简单分维定量描述。多重分形谱可以很好地定量描述多个分形区的分布的变化,分形花样稀少且分布不均匀的图形对应的分形谱较宽。经100℃退火60m in 后薄膜中出现分布不均匀的很少的分形花样,经120℃退火60m in 后分形花样布满整个薄膜表面,相应的分形谱宽度Δα从3.70 减小到0.23。

【Abstract】 The distribution and the dimension of fractal pattern of annealed Au/a\|Ge bilayer films have been studied.The variation of fractal pattern distribution can be described quantitatively using multifractal spectrum,while the variation of branch thickness of fractal can be shown using simple fractal dimension.It is demonstrated that the more nonuniform the fractals distribution,the wider the multifractal spectrum.It is also found that only a few of fractals distribute nonuniformly on film annealed at 100℃ for 60 minutes but many fractals distribute uniformly on whole film annealed at 120℃ for 60 minutes and,the width of multifractal spectrum Δα decreases from 3 70 to 0 23,respectively.

  • 【文献出处】 电子显微学报 ,JOURNAL OF CHINESE ELECTRON MICROSCOPY SOCIETY , 编辑部邮箱 ,1999年06期
  • 【分类号】O484
  • 【被引频次】8
  • 【下载频次】78
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