【摘要】 本文利用透射电镜（ＴＥＭ ）首次对缺铁条件下玉米幼苗根尖和叶片细胞结构进行了观察。证明叶细胞较根细胞对缺铁更为敏感，缺铁影响叶绿体片层的垛叠，４０ 天时叶细胞内结构解体，甚至整个细胞空泡化。根细胞中线粒体损伤最为严重，其次是高尔基体，以及细胞壁和细胞质膜。这些亚细胞结构的损伤出现顺序是与这些部位对铁的需求量密切相关的更多还原

【Abstract】 This paper first reports the observation results on the ultrastructure of cells of mzize young roots and leaves under iron\|deficient condition with TEM.The results indicated that the cells of leaves are more sensitive than that of roots under iron\|deficient condition. Iron\|deficiency influenced the formation of granas in chloroplst. The organelles of cells in the leaves was broken, even cavity appeared in the whole cell. In these cells of roots, the mitochondria structure was damage, and the structure of golgi, cell wall and plasma membrane were destroyed. These results indicated that the organelle integrity of cell is tightly related to their iron nutrient. 更多还原