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超导薄膜磁场穿透深度的精确测量

ACCURATE MEASUREMENT OF MAGNETIC PENETRATION DEPTH IN SUPERCONDUCTING FILMS

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【作者】 王瑞峰赵士平陈赓华杜寰徐凤枝杨乾声

【Author】 R.F.Wang\ \ S.P.Zhao\ \ G.H.Chen\ \ H.Du\ \ F.Z.Xu\ \ Q.S.Yang Institute of Physics and Center for Condensed Matter Physics Chinese Academy of Sciences, Beijing\ 100080

【机构】 中科院物理所凝聚态物理中心

【摘要】 磁场穿透深度λ是超导体的一个基本参数,目前,一般测试穿透深度的实验只能给出其变化量Δλ=λ(T)-λ(0),而不能得到λ的绝对值.并且由于测量精度的限制,用给定的理论模型拟合实验结果而得到的λ也有很大的不确定性.本文对此进行了详细的分析,并用双线圈互感法研究了超导薄膜穿透深度的精确测量,并给出了磁控溅射Nb膜的测量结果.我们的研究表明,这一方法能较为准确地给出λ的绝对值,从而避免了以往的测量及拟合所导致的不确定性.基于BCS理论并考虑样品有限的电子平均自由程后,理论计算结果与我们的测量结果吻合较好

【Abstract】 AbstractMagnetic penetration depth λ is a fundamental parameter of superconductors. Most of the experimental methods used to measure this quality so far are only sensitive to the change of λ . As a result, a particular theory is required to determine its absolute value, and different theories often lead to different values of λ . As a result, a particular theory is required to determine its absolute value, and different theories often lead to different values of λ . In this work, we discuss these aspects and demonstrate an accurate measurement of λ made possible by an optimized two coil mutual inductance apparatus. Our data obtained with magnetron sputtered Nb films are found to be well described by the existing theory that takes a finite electronic mean free path into account.

  • 【文献出处】 低温物理学报 ,CHINESE JOURNAL OF LOW TEMPERATURE PHYSICS , 编辑部邮箱 ,1999年04期
  • 【分类号】O484
  • 【下载频次】188
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