【摘要】 在１００ ～３００Ｋ温度范围内测量了Ｈｇ１２１２ 相块材和薄膜样品的正常态的１／ｆ 噪声，结果显示高质量薄膜的噪声水平为１０４ 量级，已和ＹＢＣＯ 外延膜及单晶相近．还测量了ＰｒＢａ２Ｃｕ３Ｏ７ － δ（ＰｒＢＣＯ） 微桥样品１／ｆ 噪声的尺寸依赖性，发现在ａｂ 面上，存在着与涨落相关的特征尺度，约为１０２μｍ 的量级．样品宽度降到该尺寸以下时，噪声水平急剧下降．在两个体系中，实验结果均和ＤｕｔｔａＨｏｒｎ 热激活模型进行了比较．更多还原

【Abstract】 The 1/ f noise in Hg 1212 bulk and film samples have been measured from 100 to 300K. The noise level of high quality Hg 1212 film is about 10\+4, which is at the same level in YBCO epitaxial films. The 1/ f noise of PrBCO bridge samples are also measured from 80 to 300K. It is discovered that there is a characteristic length in the order of 10\+2μm in ab direction, below which the noise level decreases rapidly. The experimental results are compared with the Dutta Horn′s thermal activation model.更多还原