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吡咯等离子体聚合膜及其注I~+层的复数折射率计算
Extractions of Complex Refractive Indices for the Plasma - polymerized Pyrrole Film and its Implanted Surface Layer with 20 keV I+ Ions Beam
【摘要】 以能量20keV、剂量1×1016Ⅰ+·cm-2的Ⅰ+离子束,辐照吡咯等离子体聚合膜,此表面注Ⅰ+层的电导率可提高11个量级.从光的反射和透射谱(频率范围:紫外——可见光——近红外),应用传递矩阵方法,求得原始膜和注Ⅰ+层的复数折射率,并在此光学研究的基础上,获取其能量损失函数的信息.
【Abstract】 The plasma - polymerized pyrrole film is irradiated by I+ ion beam of an energy of 2 0 keV at a fluence of 1 × 1016 cm"2 . The conductivity of the I+ implanted surface layer could be increased by 11 orders of magnitude. From the near - IR to UV reflectance and transmittance spectra, by using the transfer matrix method, we obtain the complex refractive indices of the pristine film and I+ implanted layer. On the basis of the optical studies, the information of the energy loss function is also available.
【关键词】 等离子体聚合;
复数折射率;
能量损失函数;
【Key words】 plasma polymerization; complex refractive index; energy loss function;
【Key words】 plasma polymerization; complex refractive index; energy loss function;
【基金】 国家自然科学基金资助项目,批准号:19375036
- 【文献出处】 中国纺织大学学报 , 编辑部邮箱 ,1999年01期
- 【分类号】O484.41
- 【下载频次】39