【作者】 段蒙蒙； 张洪欣； 徐军；

【Author】 DUAN Meng-meng;ZHANG Hong-xin;XU Jun;School of Electronic Engineering, Beijing University of Posts and Telecommunications;Beijing Institute of Spacecraft System Engineering;

【机构】 北京邮电大学电子工程学院； 北京空间飞行器总体设计部；

【摘要】 为了研究不同温度下对密码电路执行过程中电磁泄漏的影响,设计了温度变化对电磁攻击分析的研究方案。针对STC12C5A60S2单片机在-20℃,20℃,60℃温度下,采集了Simeck32/64密码算法运行过程中的电磁泄漏信号,分析了环境温度的变化对电磁泄漏轨迹质量的影响,并分别开展了温度相关的电磁攻击对比实验,通过寻找强电磁泄漏温度点,可以采集高质量的电磁泄漏轨迹,提升模型攻击成功率,为研究密码攻击和防御方法、改善安全系统的设计和实施提供了一种新的思路。更多还原

【Abstract】 In order to study the effect under different temperatures on the electromagnetic leakage during the execution of cryptographic circuit, a research program was designed to analyze the electromagnetic attack by temperature change. The electromagnetic leakage signals during the operation of Simeck32/64 cryptographic algorithms were collected for STC12C5A60S2microcontroller at temperatures of-20℃, 20℃, and 60℃ to analyze the influence of the change of ambient temperatures on the quality of electromagnetic leakage trajectories, and to carry out the comparison experiments of the temperature-related electromagnetic attacks respectively. By searching for strong electromagnetic leakage temperature vallue, high quality electromagnetic leakage traces can be collected and the success rate of model attack can be improved, which provides a new way of thinking for researching cryptographic attacks and defense methods, and improving the design and implementation of security systems.更多还原