【作者】 邹棋； 李金鹏； 肖培； 李高升；

【Author】 Qi Zou;Jinpeng Li;Pei Xiao;Gaosheng Li;College of Electrical and Information Engineering, Hunan University;

【机构】 湖南大学电气与信息工程学院；

【摘要】 针对日益复杂的PCB电磁兼容问题,设计了一种应用于芯片引脚的非接触电流测量方法。在基于传统微带线的非接触测量技术基础上,将应用场景适应于PCB上的芯片引脚,采用信号系统里面的线性系统理论,利用电场探头输出电压信号重构出芯片引脚电流信号,对该方法进行仿真,重构出的电流信号还原程度较高。此外还探讨了探针水平位置对信号还原度的影响。该测量方法原理简单,在PCB板级芯片管脚的电磁兼容定位分析具有较好的应用前景。更多还原

【Abstract】 Aiming at the increasingly complex electromagnetic compatibility problem of PCB, a non-contact current measurement method applied to chip pins is designed. Based on the non-contact measurement technology of traditional microstrip line, the application scenario is adapted to the chip pins on PCB. The linear system theory in the signal system is adopted that the output voltage signal of the electric field probe is used to reconstruct the chip pin current signal.The simulation of the method shows that the reconstructed current signal has a high degree of restoration. In addition, the effect of the horizontal position of the probe on the degree of signal restoration is also discussed. This measurement method is simple in principle and has a good application prospect in the electromagnetic compatibility analysis of PCB level chip pins.更多还原