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Experimental Device-independent Tests of Quantum Measurements
【作者】 Aonan Zhang; 谢杰; Michele Dall’Arno; Francesco Buscemi; Huichao Xu; Kaimin Zheng; Han Zhang; Vlatko Vedral; Lijian Zhang;
【Author】 Aonan Zhang;Jie Xie;Michele Dall’Arno;Francesco Buscemi;Huichao Xu;Kaimin Zheng;Han Zhang;Vlatko Vedral;Lijian Zhang;College of Engineering and Applied Sciences and School of Physics,Nanjing University;Centre for Quantum Technologies,National University of Singapore;Graduate School of Informatics,Nagoya University;Atomic and Laser Physics,Clarendon Laboratory,University of Oxford;
【机构】 College of Engineering and Applied Sciences and School of Physics,Nanjing University; 南京大学; Centre for Quantum Technologies,National University of Singapore; Graduate School of Informatics,Nagoya University; Atomic and Laser Physics,Clarendon Laboratory,University of Oxford;
【摘要】 The certification of a theoretical model for quantum measurements is of vital importance in quantum information tasks. However, such certification usually relies on extra assumptions on the state-generating devices. Recently, the device-independent(DI) way of testing quantum measurements has been introduced and the set of input-output correlation compatible with any qubit measurement has been fully characterized. Here we implement two kinds of important measurements in quantum information science, the mutually unbiased bases(MUBs) and symmetric informationally complete(SIC) measurements, with practical photonic apparatus, and experimentally test them in a DI way with the theoretical hypotheses and their reconstructed measurements using conventional quantum detector tomography. In particular, we develop and demonstrate a novel way of characterizing quantum measurements motivated by the DI test, relaxing assumptions on the preparation apparatus. Our results open a new avenue in the fundamental issue of characterizing quantum measurements, and pave the way to novel tools for quantum information science and applications.
【Abstract】 The certification of a theoretical model for quantum measurements is of vital importance in quantum information tasks. However, such certification usually relies on extra assumptions on the state-generating devices. Recently, the device-independent(DI) way of testing quantum measurements has been introduced and the set of input-output correlation compatible with any qubit measurement has been fully characterized. Here we implement two kinds of important measurements in quantum information science, the mutually unbiased bases(MUBs) and symmetric informationally complete(SIC) measurements, with practical photonic apparatus, and experimentally test them in a DI way with the theoretical hypotheses and their reconstructed measurements using conventional quantum detector tomography. In particular, we develop and demonstrate a novel way of characterizing quantum measurements motivated by the DI test, relaxing assumptions on the preparation apparatus. Our results open a new avenue in the fundamental issue of characterizing quantum measurements, and pave the way to novel tools for quantum information science and applications.
- 【会议录名称】 第十八届全国量子光学学术会议摘要集
- 【会议名称】第十八届全国量子光学学术会议
- 【会议时间】2018-10-27
- 【会议地点】中国湖南张家界
- 【分类号】O431.2
- 【主办单位】中国物理学会量子光学专业委员会