【作者】 张运春； 肖文； 伊小素； 韩艳玲； 刘德文；

【Author】 ZHANG Yun-chun,XIAO Wen,YI Xiao-su,HAN Yan-ling,LIU De-wen(School of Instrumentation Science & Optoelectronics Engineering,Beijing University of Aeronautics and Astronautics,Beijing 100083,China)

【机构】 北京航空航天大学仪器科学与光电工程学院；

【摘要】 针对半导体激光器(LD)应用领域十分广泛的特点,提出了一种新型LD功率(P)-电流(I)-电压(V)的自动测试方法。该方案采用华邦51系列单片机(SCM)W78E58BP作为控制核心,实现了高稳定度的LD连续及脉冲驱动、恒流控制及功率、电压采集。LD控制单元中,应用负反馈技术实现注入电流I f、驱动电压Vf和光功率PO的高稳定控制,电流控制精度为±0.1%;单片机控制电信号的放大、保持和采集,模拟、数字相结合,提高了信号处理的精度。最后,给出了通过RS-232接口对LD进行PIV测试的曲线及相关参数的测试结果,并给出了误差分析。该测试方法已得到广泛应用。更多还原

【Abstract】 A new power(P)-current(I)-voltage(V) automatic testing technique of semiconductor laser diode controlled by single-chip microcomputer(SCM) considering LD much wide application was presented.In this paper,SCM was introduced as system control center,which realized reliable constant current and pulse current driver for laser diode,optical power collection and voltage collection.In laser diode driver control module,negative feedback technique was used to control drive current(I f),output optical power(Po) and forward voltage(Vf) respectively with high stability,the accuracy of constant current is ±0.1%.Furthermore,magnification,maintenance and collection of electronic signal were executed by both digital circuit and stimulant circuit controlled by SCM,which made signal processing much higher precise.In the end,PIV testing curves and related parameters of laser diodes were presented based on the testing method,and the error of testing result was analyzed.The PIV testing method’s application range is extended.更多还原