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中频反应磁控溅射法制备Al2O3:Ce3+发光薄膜工艺条件优化
Optimization of Fabrication Prarameters of Al2O3: Ce3+ Films Prepared by Medium Frequency Reactive Magnetron Sputtering
【Author】 Liao Guojin Ba Dechun Wen Lishi Liu Siming Yan Shaofeng (Faculty of Mechanical Engineering and Automation,Northeastern University, shenyang 110004,China; Faculty of Mechanical Engineering and Automation, Liao-ning Institute of Industry, jinzhou 121001,China; Department of surface engineering, Institute of Metal Research Chinese Academy of Science, shenyang 110016,China; Faculty of Mechanical Engineering and Automation,Beijing University of Aeronautics and Astronautics, 100083 China)
【机构】 东北大学机械与自动化学院; 中国科学院金属研究所表面工程部; 北京航空航天大学机械与自动化学院; 辽宁工学院机械与自动化学院;
【摘要】 中频反应磁控溅射技术近年来得到了广泛地应用。采用该技术制备的Al2O3:Ce3+薄膜具有优良的蓝色发光性能。本文采用四因素四水平正交实验方法,对中频磁控溅射法制备的Al2O3:Ce3+薄膜工艺参数进行优化,得到了制备具有良好发光性能薄膜的优化条件是:掺杂浓度1.1%,溅射总压强0.4 Pa,靶基距70 mm,氧分压比9%。结果表明,中频反应磁控溅射制备的Al2O3:Ce3+具有强烈的宽带光致发光。
【Abstract】 Medium Frequency Reactive Magnetron sputtering (MFRMS) is being widely used in many fields. Al2O3:Ce3+ films prepared by MFRMS have better luminescent characters. Al2O3:Ce3+ films deposited by MFRMS technology are studied on luminescence in the way of the four-factor and four-level orthogonal experimental method. It is found that the optimized fabrication parameters of Al2O3:Ce3+ thin films with good luminescent properties are that cerium doping concentration is 1. 1 at. %, the distance of the targets and substrate is 70 mm, the oxygen partial pressure rate is 9%, and the sputtering pressure is 0. 4 Pa. The experimental results shows that the Al2O3:Ce3+ films prepared by MFRMS technology have good wide bend emitting property.
【Key words】 Magnetron Sputtering; Al2O3 : Ce3+; Thin Films; Luminescence; Orthogonal Experiment; Optimized Fabrication;
- 【会议录名称】 真空冶金与表面工程——第八届真空冶金与表面工程学术会议论文集
- 【会议名称】第八届真空冶金与表面工程学术会议
- 【会议时间】2007-06
- 【会议地点】中国辽宁沈阳
- 【分类号】TB383.2
- 【主办单位】中国真空学会真空冶金专业委员会