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中频反应磁控溅射法制备Al2O3:Ce3+发光薄膜工艺条件优化

Optimization of Fabrication Prarameters of Al2O3: Ce3+ Films Prepared by Medium Frequency Reactive Magnetron Sputtering

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【作者】 廖国进巴德纯闻立时刘斯明阎绍峰

【Author】 Liao Guojin Ba Dechun Wen Lishi Liu Siming Yan Shaofeng (Faculty of Mechanical Engineering and Automation,Northeastern University, shenyang 110004,China; Faculty of Mechanical Engineering and Automation, Liao-ning Institute of Industry, jinzhou 121001,China; Department of surface engineering, Institute of Metal Research Chinese Academy of Science, shenyang 110016,China; Faculty of Mechanical Engineering and Automation,Beijing University of Aeronautics and Astronautics, 100083 China)

【机构】 东北大学机械与自动化学院中国科学院金属研究所表面工程部北京航空航天大学机械与自动化学院辽宁工学院机械与自动化学院

【摘要】 中频反应磁控溅射技术近年来得到了广泛地应用。采用该技术制备的Al2O3:Ce3+薄膜具有优良的蓝色发光性能。本文采用四因素四水平正交实验方法,对中频磁控溅射法制备的Al2O3:Ce3+薄膜工艺参数进行优化,得到了制备具有良好发光性能薄膜的优化条件是:掺杂浓度1.1%,溅射总压强0.4 Pa,靶基距70 mm,氧分压比9%。结果表明,中频反应磁控溅射制备的Al2O3:Ce3+具有强烈的宽带光致发光。

【Abstract】 Medium Frequency Reactive Magnetron sputtering (MFRMS) is being widely used in many fields. Al2O3:Ce3+ films prepared by MFRMS have better luminescent characters. Al2O3:Ce3+ films deposited by MFRMS technology are studied on luminescence in the way of the four-factor and four-level orthogonal experimental method. It is found that the optimized fabrication parameters of Al2O3:Ce3+ thin films with good luminescent properties are that cerium doping concentration is 1. 1 at. %, the distance of the targets and substrate is 70 mm, the oxygen partial pressure rate is 9%, and the sputtering pressure is 0. 4 Pa. The experimental results shows that the Al2O3:Ce3+ films prepared by MFRMS technology have good wide bend emitting property.

【基金】 国家自然科学基金资助项目(50376067)
  • 【会议录名称】 真空冶金与表面工程——第八届真空冶金与表面工程学术会议论文集
  • 【会议名称】第八届真空冶金与表面工程学术会议
  • 【会议时间】2007-06
  • 【会议地点】中国辽宁沈阳
  • 【分类号】TB383.2
  • 【主办单位】中国真空学会真空冶金专业委员会
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