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压力传感器的温度特性及其校验系统

TEMPERATURE AFFECTION OF PRESSURE TRANSDUCER AND ITS VERIFICATION SYSTEM

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【作者】 厉彦忠苏林王江张玉文

【Author】 Li Yanzhong Su Lin Wang Jiang Zhang Yuwen (Department of Refrigeration & Cryogenics Engineering, Xi’an Jiaotong University, 710049)

【机构】 西安交通大学制冷与低温工程系

【摘要】 压力传感器性能易受温度变化的影响,从而增加了测量结果的误差。针对这一问题,本文设计了一种变温压力传感器校验系统,能够在-80℃-环境温度、0-0.8 MPa压力范围内对压力传感器进行校验。文中对一种普通压力传感器进行了测试,得出了不同温度下输出电势随压力变化的关系,并归纳出了输出电势与输入压力和温度的关系式。研究表明:变温压力传感器校验系统的建立,对于检测压力传感器的温度特性、实现低温下压力精确地测量具有重要的应用价值,同时对于发展和促进我国压力传感器的检定技术也具有重要的实际意义。

【Abstract】 Performance of the pressure transducer is prone to change under the influence of temperature, resulting in the enlargement of measurement error. In this article, a measuring system for pressure transducer is designed according to this problem, which can work under various temperatures ranging from -80℃ to ambient temperature and its pressure limit is from 0 to 0.8 MPa. The relations between output voltage and input pressure under different temperatures are achieved after a series of tests on a common pressure transducer using this system. Furthermore, a formula has been obtained between the output voltage, the input pressure and the temperature according to the above relation. It is proved that the work is of great significance both in checking temperature characteristic of the pressure transducer and in realizing accurate measurement in low temperature condition.

  • 【会议录名称】 第六届全国低温与制冷工程大会会议论文集
  • 【会议名称】第六届全国低温与制冷工程大会
  • 【会议时间】2003-11
  • 【会议地点】中国陕西西安
  • 【分类号】TP212
  • 【主办单位】中国制冷学会第一专业委员会、第二专业委员会
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