【作者】 包军林； 庄奕琪； 杜磊； 李伟华；

【Author】 Bao Junlin Zhuang Yiqi Du lei Li Weihua (Research Inst. of Microelectronics ,Xidian Uni., Xi’an 710071,China)

【机构】 西安电子科技大学微电子研究所；

【摘要】 低频噪声已经作为一个重要的参量用于军用电子元器件的可靠性筛选和评估。介绍了一种基于虚拟仪器的电子器件低频噪声测试分析系统。与传统以通用仪器组建的噪声测试系统相比,不仅成本低,而且实现了电子器件低频噪声的实时、快速测量,并可对其各个表征参量进行准确的分析和提取。更多还原

【Abstract】 As an important way,the low-frequency noise has been used to evaluate and screen the reliability of military-used electronic device. A noise testing and analyzing system of electronic device,based on the idea of virtual instrumentation,is introduced. This system not only has a higher ratio of performance to price than the former one,which is assembling the commonly used apparatus into a testing system,but also can make a fast and real-time noise’s measure,including all its parameters analyzed and picked-up exactly.更多还原