【作者】 蔡烁； 邝继顺； 崔昌明；

【Author】 Cai Shuo Kuang Ji-shun (School of Computer and Communication, Hunan University, Changsha 410082, China)

【机构】 湖南大学计算机与通信学院；

【摘要】 瞬态电流测试(IDDT Testing)作为传统电压测试和稳态电流测试方法的一个补充, 越来越受到研究领域和工业界的关注。针对不同的故障类型,基于瞬态电流测试的测试产生方法也有所不同。这里提出了一种关于延时故障的测试产生算法。该算法利用3个向量来激活延时故障。通过基于布尔过程的波形模拟器计算得到正常电路和故障电路的跳变差, 并利用PSPICE软件对测试产生结果的有效性进行了模拟。实验结果表明该测试产生算法用于检测延时故障是可行的。更多还原

【Abstract】 Recently, IDDT test used as a complement of the voltage test and IDDQ test gains more and more attention of the research and industry field. Directing at different fault model, the test method based on IDDT test is also different. This paper proposes a new algorithm for transient current test (IDDT) generation for delay fault. The algorithm uses three patterns to activate delay fault. Waveform simulator based on Boolean process counts the difference of logical changes between fault circuits and fault-free circuits. PSPICE simulation experiments were done on the effectiveness of the test vectors generated by this algorithm. The results prove this test generation algorithm is feasible.更多还原