【作者】 张月； 李华伟； 宫云战； 李晓维；

【Author】 Yue Zhang, Huawei Li, Yunzhan Gong, and Xiaowei Li ( Information Department, Academy of Armored Forces Engineering, Beijing 100072, China) ( Institute of Computing Technology, Chinese Academy of Sciences, Beijing 100080, China)

【机构】 装甲兵工程学院信息工程系； 中国科学院计算技术研究所网络室；

【摘要】 超深亚微米工艺下,串扰的出现会导致在电路设计验证、测试阶段出现严重的问题。本文介绍了一个基于波形敏化的串扰时延故障测试生成算法。该算法以临界通路上的串扰时延故障为目标故障进行测试产生,大大提高了算法的效率。实验表明,以该算法实现的系统可以在一个可接受的时间内,对一定规模的电路的串扰时延故障进行测试产生。更多还原

【Abstract】 Current design trends have shown that crosstalk issues in deep sub-micron can cause severe design validation and test problems. In this paper, we address the problem of delay testing considering crosstalk-induced delay effects. A delay test pattern generation technique is proposed base on waveform sensitization. Crosstalk-induced effects on critical paths are targeted to improve test effectiveness of delay testing. Therefore, it can be applied to circuits of reasonable sizes by generating delay tests considering crosstalk-induced effects within an acceptable amount of time.更多还原