TbFe磁性薄膜的磁力显微镜(MFM)成像研究

【作者】 周宇； 王志红； 陈琨；

【机构】 电子科技大学微固学院纳米分析中心；

【摘要】 本文介绍了利用磁力显微镜(MFM)对TbFe磁性薄膜进行的不同抬举距离(60-780nm)的成像比较实验。在实验中,比较了低抬举距离(100nm以下)磁力像中样品——针尖的互相干扰。同时发现在高抬举距离磁力像中,随抬举距离增大,出现了与形貌对应的黑斑及与之相关的亮沿。亮沿随抬举距离的变化也改变着位置与强度。更多还原

【Abstract】 This paper has introduced a magnetic force microscopy on TbFe magnetic thin film of long range variation of lift distance (60-780nm). In this experiment, the sample—tip disturbance under 100nm in the magnetic force images was analyzed. And it was found that, some dark figures conforming to the topographical image appeared when the lift distance was large. Moreover, there were bright contours, which were changing their position and strength as the lift distance increased, on the edges of the dark figures.更多还原