节点文献
纳米晶体硅量子点场发射冷阴极的研究
Study on Cold Electron Emission Based on Nanocrystalline Silicon Quantum Dots
【Author】 Wu Chengchang Xiao Xia Zhao Xinwei Zhang Shengcai Tianjin University,Tianjin,300072 Science University of Tokyo, Tokyo, Japan, 162 - 8601
【摘要】 在n-Si(4-5Ω·cm)衬底上淀积了400nm厚的纳米晶体硅(nc-Si)量子点薄膜,将其制备成场致发射的冷阴极。介绍了nc-Si量子点冷阴极的制备,场致发射特性的测试,解释了nc-Si量子点冷阴极的工作模型及电子弹道发射的原理。透射电子显微镜(TEM)对样片的结构分析证实样片中的nc-Si量子点具有很好的单晶结构;原子力显微镜(AFM)对样片的表面形貌分析表明,样片具有平滑的表面,有利于提高冷阴极的发射效率。
【Abstract】 400nm -thick nanocrystalline silicon (nc -Si) quantum dots films have been deposited on the n - Si (4-5Ω· cm) substrate, and fabricated as the cold cathode of the field emission. The fabrication process of nc -Si quantum dots cold cathode and the measurement system were described in detail. The transmission electron microscope (TEM) verifies the single crystal structure of the nc -Si quantum dots in the sample. A smooth surface of the sample is observed by atom force microscope (AFM), which is benefit for increasing the emission efficiency of the cold cathode.
【Key words】 nanocrystalline silicon quantum dot; field emission; cold cathode; ballistic electron;
- 【会议录名称】 中国微米、纳米技术第七届学术会年会论文集(一)
- 【会议名称】中国微米、纳米技术第七届学术会年会
- 【会议时间】2005-08
- 【会议地点】中国大连
- 【分类号】TN383.1
- 【主办单位】中国机械工程学会