【作者】 方克明； 邹兴； 林杰； 王雪静； 邓庚凤；

【Author】 FANG Ke-ming,ZOU Xing, LIN Jie,WANG Xue-jing,DENG Geng-feng(University of Science and Technology Beijing, Beijing 100083, China)

【机构】 北京科技大学理化系； 济南钢铁集团公司；

【摘要】 介绍了一种适用性很广的材料微观结构表征法。应用该技术可以从粉体及其改性颗粒试样中切取可供透射电镜研究的薄膜,对微观结构进行表征。制样的效率高,薄膜的薄区大,完整性好。对材料微观结构的透射电镜和高分辨电镜表征具有重要意义。更多还原

【Abstract】 This paper aims to introduce a widely used FKM preparation method. By means of this method, a thin film applicable for TEM observation can be cut from particles. In addition, this method has a high efficiency and the quality of the films is good. As a result, this method is very helpful to TEM and HREM characterization of powders.更多还原