节点文献
在扫描电镜下通过单壁碳纳米管的辅助作用观察硅/二氧化硅衬底上纳米半导体颗粒的形貌
Visualization of semiconductor nanoparticles on Si/SiO2 substrate with the assistance of single-walled carbon nanotubes by SEM
【Author】 Weiwei Zhou, Haibin Chu, Lei ding, Yan Li* College of Chemistry and Molecular Engineering, Peking University, 100871, Beijing
【机构】 北京大学化学与分子工程学院；
【Abstract】 Scanning electron microscope (SEM) has been widely applied in the characterization of nanomaterials on substrates. However, the dispersed semiconductor nanoparticles below several ten nanometers can not be visualized by SEM. We found that by the assistant of single-walled carbon nanotubes (SWNTs), semiconductor nanoparticles of TiO2, CdS et al. with the size below 10 nm can be clearly observed on Si/SiO2 substrate using SEM. This technique is important for the further application of SEM in the area of nanoscience.
- 【会议录名称】 中国化学会第二十五届学术年会论文摘要集（上册）
- 【会议名称】中国化学会第二十五届学术年会
- 【会议时间】2006-07
- 【会议地点】中国吉林长春
- 【分类号】TB383.1
- 【主办单位】中国化学会