【作者】 段玉霞； 张存林； 冯立春； 刘波；

【Author】 DUAN yuxia, ZHANG Cunlin, FENG Lichun, LIU Bo(Capital Normal University Department of Physics, Beijing 100037)

【机构】 首都师范大学物理系；

【摘要】 利用红外热波技术对印刷电路板(PCB)及集成电路(IC)进行检测有诸多方面的优点,如:检测速度快,非接触,测量结果直观易懂等,因而受到了越来越广泛的关注。本文在调研国内外资料的基础上介绍了红外热波技术诊断印刷电路板(PCB)的原理、现代PCB红外诊断的基本过程及红外热波检测技术中动态激励方法的应用,最后介绍了近几年兴起的锁相红外热波检测技术的基本原理,以及锁相技术在IC检测中的成功应用。更多还原

【Abstract】 Thermal wave technique has much superiority in PCB and IC detecting, such as rapid, non-contact, and visual, therefore this technique has attracted much attention. On the foundation of investigating the domestic and foreign materials, this paper introduces the principle of PCB diagnosis by using IR thermal wave testing technique, basic processes of PCB IR diagnosis and the application of the dynamic excitation in thermal wave testing. Finally the basic principle of lock-in IR thermal wave testing technique, rising in recent years, and the successful application in IC testing by using lock-in technology are introduced.更多还原