【作者】 蔡金青； 王锐； 高明伦；

【Author】 Cai Jinqing Wang Rui Gao Minglun (The Institute of VLSI Design , Hefei University of Technology, Hefei 230009)

【机构】 合肥工业大学微电子设计研究所；

【摘要】 边界扫描技术是符合IEEE规范的一种测试方法,它的设计的实现降低了测试的复杂度, 适合进行超大规模集成电路的测试。本文介绍了边界扫描技术的概念、特点及其设计方法,给出了设计的部分框架,讨论了边界扫描技术的应用。更多还原

【Abstract】 Boundary-scan technology is the test methodology of IEEE specification. Its implementation reduces the complexity of the testing and is suitable for VLSI testing. In this paper the boundary-scan conception, features and design methods are introduced. Its design frame is also shown. Finally, its application is discussed.更多还原