【作者】 陈晓梅； 孟晓风；

【Author】 Chen Xiaomei~(1,2) Meng Xiaofeng~1 (1 College of Instrument Science and Optoelectronics Engineering,Beijing Univ.of Aeronautics and Astronautics,Beijing 100083,China; 2 College of Electrical and electronic engineering,North china electric power university,Beijing 102206,China)

【机构】 北京航空航天大学仪器科学与光电工程学院；

【摘要】 混合信号电子电路在现代电子产品中必不可少,其测试性分析成为学者研究的热点。本文系统地阐述了混合信号电路的测试性分析方法(TTF 方法,离散事件系统 DES 方法,单信号依赖模型方法,多信号依赖模型方法)的基本思路、研究现状、实践应用情况及其优缺点。最后,本文展望了未来的研究热点方向。更多还原

【Abstract】 The mixed-signal circuit is necessary for modern electronic products,and the research on the testability of mixed-signal circuit becomes the highlighted topic.In this paper,several different testability analysis methods are systematically summarized and discussed,which include TTF method,DES method,single dependency meth- od,multi-signal method.The basic idea,the research status,the practice and application instances,and the advan- tage/disadvantage of the every method are discussed.At last,the future research topics are predicted.更多还原