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高纯钯中痕量杂质的电感耦合等离子体质谱测定方法研究
Study on the Determination of Trace Impurities in High Purity Palladium by Inductively Couple Plasma-Mass Spectrometry
【Author】 Liu Xiangsheng Zhang Anding Pan Yuanhai Liu Yulong (Beijing General Research Institute for NonFerrous Metals, Beijing 100088, China)
【机构】 北京有色金属研究总院;
【摘要】 建立了高纯钯中16种痕量杂质的电感耦合等离子体质谱测定方法。考察了基体 Pd 的谱干扰和基体效应,采用 Sc、Cs 双内标补偿基体对待测信号的抑制。方法检出限为0.002μg/L~0.04μg/L,加标回收率为86%~114%,分析精密度为0.6%~3.9%。方法简便、快速、灵敏、准确。
【Abstract】 The method of inductively coupled plasma-mass spectrometry for the determination of impurities of 16 trace elements in highly pure palladium was studied.The spectral interference and matrix effect for palladinm on the method were discussed.The matrix suppression effect of palladinm on signal could effectively be eliminated by using Sc,Cs as internal standard.The determination limit is 0.002μg/L~0.04μg/L,the recovery rate of standand addition is 86 %~114 %,precision is 0.6 %~3.9 %.This method is simple,rapid,sensitive and accurate.
【Key words】 Inductively coupled plasma-mass spectrometry; highly pure palladium; trace impurities; internal standard;
- 【会议录名称】 第三届科学仪器前沿技术及应用学术研讨会论文集(三)
- 【会议名称】第三届科学仪器前沿技术及应用学术研讨会
- 【会议时间】2006-06
- 【会议地点】中国北京
- 【分类号】TG115.3
- 【主办单位】《现代科学仪器》编辑部