【作者】 王铁山； 王志国； 高东风；

【Author】 Wang Tieshan Wang Zhiguo Gao Dongfeng (Institute of Modern Physics,Academia Sinica, Lanzhou, 730000)

【机构】 中国科学院近代物理研究所；

【摘要】 本文重点研讨通过改变探测器偏压,进而改变探测器的PN节(有效探测灵敏区)厚度,实现对带电粒子的种类和能量鉴别的实验方法及其实际应用。实验测量了3MeV质子和6．05MeVα粒子在金硅面垒探测器Si (Au)中的能损与探测器偏压关系曲线。同时利用刻度过的探测器鉴别氘离子束轰击氘钛(TiDx)靶发射的带电粒子能谱。在很强的本底情况下通过调节探测器偏压(灵敏区厚度)实现了对能量相近的不同带电粒子的有效鉴别和测量。更多还原

【Abstract】 The experimental method for the identification of charged particles with single Si(Au) detector is diacussed in this paper. The active thickness of Si(Au) detector was adjusted by the change of the applied voltage on it. The calibration curves of peak location vs voltage were measured with the Thc-Thc’ alpha source (Ea=6. 05MeV) and D-D proton (Ep=3.0MeV). This method was applied to measure the charged particle spectrum from d+TiDx reaction. The charged particles with the similar energy from secondary reactions were identified under very strong background.更多还原