【作者】 南利平； 吕洪国； 李明光；

【Author】 Nan Liping Lu Hongguo Li Mingguang (Dept of Communications Beijing Information Technology Institute Beijing 100101) (Dept of Electronic Engineering Tsinghua University Beijing 100084) (Shanghai Broadcom Company Shanghai 200040)

【机构】 北京信息工程学院； 清华大学； 上海博通公司；

【摘要】 本文分析了手机中杂散信号产生的主要根源是各种器件的非线性,介绍了抑制杂散信号和防止它们幅射出去的2种方法。本文还介绍了手机杂散信号的测试系统和方法以及手机杂散信号电平测试的条件。更多还原

【Abstract】 The paper discussed the source of spurious radiation of handset. The spurious radiation is due to non-linear characteristic of power amplifier, devices and other chips. There are two method to prevent spurious radiation from handset: one is shielding power amplifier and others is de-coupling battery routing. The system used to measure spurious level and the test conditions is presented.更多还原