【作者】 张栋； 高成；

【Author】 ZHANG Dong,GAO Cheng Institute of Reliability Engineering, BeiHang University, Beijing, China, 100191

【机构】 北京航空航天大学可靠性工程研究所；

【摘要】 大规模数字集成电路的测试程序开发是个复杂的系统工程,在开发过程中可能会涉及到测试工程师、IC设计工程师、PCB工程师等多方的协作。本文以美国CREDENCE公司的大规模集成电路测试系统SAPPHIRE为依托,主要从测试工程师开发测试程序的角度对测试图形的获取、功能测试、参数测试等方面进行探讨,简要介绍大规模数字集成电路测试开发的流程及发展趋势。更多还原

【Abstract】 Test programs development of Digital Large-Scale Integrated Circuits is a complex task. Test engineers often work with IC design engineers and PCB engineers during the process. This paper mainly describes the development flow of test programs, including test pattern generation, functional test and parametric test, etc. IC test we discussed is based on ATE, especially SAPPHIRE from Credence Systems Corporation. At last, the trend of testing development is analyzed.更多还原