【作者】 刘帅洪； 仵建平； 吴勇； 杜磊；

【Author】 Liu Shuaihong Wu Jianping Wu Yong Du Lei (No. 771 Research Institute of China Aerospace Shi Dai electronic Company, Xi’an 710054 School of Technical Physics, Xidian University, Xi’an 710071 School of Micro electronics, Xidiom Vniversity, Xi’an 710071)

【机构】 中国航天时代电子公司第771研究所； 西安电子科技大学技术物理学院； 西安电子科技大学微电子学院；

【摘要】 厚膜电阻器是混合集成电路中最重要的元件之一。厚膜电阻器以其价格低廉、性能稳定和可靠性高而备受电路设计者的青睐。但是,厚膜电阻器的噪声大是不争的事实。为了能够在精密电路中应用,必须测量和控制电阻器的噪声。近年来,国内外学者发现厚膜电阻器的噪声与厚膜材料结构和质量有密切关系。本文通过厚膜电阻器例行可靠性实验中噪声测量和分析,与常规测量参数对比,探索噪声用于厚膜电阻器例行可靠性实验表征的可行性。更多还原

【Abstract】 Thick film resistance is one of the most important components in hybrid integrated circuit. Because of its cheap price, stable property and high reliability, the thick film resistance finds favor with the circuit designers. However high thick film resistance noise is undisputed fact. In order to be used in precision circuits, resistance noise must be measured and controlled. Recently scholars at home and abroad have found the noise of thick film resistance is closely related to the structure and quality of thick film material. The aim of this paper is to explore the feasibility of noise used in characterization of thick film resistance in routine reliability experiment by noise measurement and analysis of thick film resistance in routine reliability experiment and comparison with traditional measurement parameters.更多还原