【作者】 张鹏； 赵建林； 周俭波； 徐宏来； 杨德兴； 范琦；

【Author】 ZHANG Peng**, ZHAO Jian-lin, ZHOU Jian-bo, XU Hong-lai, YANG De-xing, FAN Qi (Institute of Optical Information Science and Technology, School of Science, Northwestern Polytechnical University, Xi’an 710072, China)

【机构】 西北工业大学理学院光信息科学与技术研究所；

【摘要】 理论和实验研究了应用数字全息术对光写入波导的折射率分布进行测量的方法。采用马赫-曾德干涉仪光路,利用CCD记录光敏感材料在波导写入前后的像面全息图,通过使数值再现出的两个全息物场的相位相减而提取出反映波导折射率分布的相位差信息,从而实现对光写入波导器件折射率分布的测量。对LiNbO3:Fe晶体中光写入平面波导阵列的折射率分布的实验测量结果表明该方法是可行的。最后,详细讨论了像面数字全息术应用于测量光写入波导折射率分布时的适用条件,并简要讨论了该测量方法的精度。更多还原

【Abstract】 The method for measuring the index distributions of light-induced optical waveguides by employing digital holography is investigated both theoretically and experimentally. Two image holograms of a photosensitive media before and after the waveguide fabrication in a Mach-Zehnder interferometer are recorded by a CCD. From these holograms, the phase differences, which contain the information of the index distributions of the waveguide region, are determined by utilizing numerical reconstruction. The index distribution of a light-induced planar waveguide array in a LiNbO3:Fe crystal is experimentally measured. The results show that the method is feasible. Additionally, the applicabilities of the digital image holography for measuring the index distributions of the light-induced optical waveguides are discussed in detail.更多还原