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γ射线辐照对数字型彩色CMOS图像传感器输出特性的影响
Effect of Gamma-ray Irradiation on Output Characteristic of Color CMOS Digital Image Sensors
【Author】 MENG Xiang-ti;KANG Ai-guo;HUANG Qiang Institute of Nuclear and New Energy Technology, Tsinghua University, Beijing 100084, China
【机构】 清华大学核能与新能源技术研究院;
【摘要】 研究了数字型彩色CMOS图像传感器的γ射线辐照效应。采用不同γ射线注量进行积累辐照和单次辐照。积累辐照后捕获的图像在1.2kGy时变得非常差,而单次辐照后图像在1.8kGy时才变得非常差。积累辐照由于类似加电模式而比单次辐照时性能退化严重。
【Abstract】 Radiation effect of color CMOS digital image sensors was studied by accumu-lative radiation and sing1e dose radiation at different γ-ray doses. The quality of the pic-ture captured under natural lighting is very poor only at 1.2 kGy for accumulative radia-tion, but at 1.8 kGy for single dose radiation, showing that the radiation-induced degra-dation of the device performance for the sensor with accumulative γ-ray doses is muchmore severe than those with single dose due to like power-on mode.
【Key words】 semiconductor; CMOS image sensors; radiation effect; output characteristic;
- 【会议录名称】 第三届北京核学会核应用技术学术交流会论文集
- 【会议名称】第三届北京核学会核应用技术学术交流会
- 【会议时间】2004
- 【分类号】TP212
- 【主办单位】北京核学会