【作者】 王立锦； 张辉； 张金中； 滕蛟； 于广华；

【Author】 WANG Li-jin ZHANG Hui ZHANG Jin-zhong TENG Jiao YU Guang-hua (School of Materials Science and Engineering,University of Science and Technology Beijing,Beijing 100083)

【机构】 北京科技大学材料科学与工程学院；

【摘要】 概述了探针法金属薄膜磁电阻效应的测试原理,分析了探针因子对测量结果的影响。利用2182 纳伏表等仪器设计组装出了测试系统,实现了磁性薄膜材料磁电阻效应的高精度测量。给出了微机控制软件关键子程序的 C++语言源程序。该系统集数据采样、数据处理、参数计算等功能于一体,用户界面友好、测试范围宽、精度高等特点。系统软件还能在计算机屏幕、打印机上绘出被测样品的磁电阻效应曲线,井生成标准数据文件供 ORIGIN 等数据处理软件调用。对实际金属薄膜样品进行了测试分析,效果良好。更多还原

【Abstract】 Firstly the testing principle of the magnetoresistive effect of metal films by the probe-method was introduced.The effect of the probe factor on the measuring result was analyzed.A high accuracy testing system was designed and made by using 2182 nanovoltmeter and other instrument.The key subprogram in C language for computer control was given.This system gathers the function of sampling data,processing data and calculating parameters together,and has a friendly interface,a wide test range as well as high precision.The system soft ware can draw or output the magnetoresistive effect curve of sample at computer screen or printer, and it can produces the standard data file which support some data processing software such as ORIGIN.A real magnetoresistive metal film sample was tested and analyzed.The results indicate that the testing system works very well.更多还原