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“弱p型”碲镉汞材料和“陷阱模式”光导探测器

Slightly p-type HgCdTe and trapping-mode photoconductive HgCdTe detectors

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【作者】 张可锋林杏潮张莉萍王仍焦翠灵陆液王妮丽李向阳

【Author】 ZHANG Kefeng,LIN Xingchao,ZHANG Liping,WANG Reng,JIAO Cuiling,LU Ye,WANG Nili,LI Xiangyang (Key Laboratory of Infrared Imaging Materials and Detectors,Shanghai Institute of Technical Physics,Chinese Academy of Sciences,Shanghai 200083)

【机构】 中国科学院上海技术物理研究所红外成像材料与器件重点实验室

【摘要】 窄禁带碲镉汞(HgCdTe)为电子和空穴混合导电的多载流子体系材料,特别是对于"弱p型"材料,由于电子和空穴的迁移率相差大约两个数量级,更容易受到少数载流子电子的干扰,因此单一磁场的霍尔测试无法区分迁移率较低性能较差的n型材料和p型材料。本文通过变温变磁场的霍尔测试对两种碲镉汞材料的磁输运特性进行了测试区分。另外,本文还对由"弱p型"材料制备的"陷阱模式"光导器件的工作机理进行了初步分析,解释了这种器件相对于传统器件所表现出的独特优势。

【Abstract】 Very-narrow-gap bulk-grown HgCdTe single crystals were multicarrier semiconductor system material,since multiple electrons and holes species frequently contribute to the conduction.Especially,for the slightly p-type HgCdTe single crystals,the evaluated based on conventional measurements at a single magnetic field could lead to erroneous conclusions,because of the large ratio of the electron mobility to hole mobility (b=μ e /μ h ≈10 2).The n-type with poor mobility and slightly p-type with excellent electrical properties couldn’t be distinguished by the conventional single-field data.Variable-magnetic-field Hall measurements were performed on bulk-grown HgCdTe single crystals at various temperatures in this paper.From the results,the Variable-magnetic-field Hall measurements were found to be a suitable tool for differentiation electrical characterization of the two type HgCdTe single crystals.The operating principle of the trapping-mode photoconductive HgCdTe detectors was investigated.

【关键词】 霍尔测量HgCdTe磁输运陷阱模式
【Key words】 Hall measurementsHgCdTemagneto-transporttrapping-mode
【基金】 上海市自然科学基金资助项目(10ZR1434500)
  • 【会议录名称】 中国光学学会2010年光学大会论文集
  • 【会议名称】中国光学学会2010年光学大会
  • 【会议时间】2010-08-23
  • 【会议地点】中国天津
  • 【分类号】TN215
  • 【主办单位】中国光学学会
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