【作者】 宋银； 贺德衍； 张崇宏； 杨义涛； 李炳生； 马艺准； 缑洁； 姚存峰； 谢二庆；

【Author】 SONG Yin (1,2) HE De-yan (2) ZHANG Chong-hong (1) YANG Yi-tao (1) LI Bin-sheng (1) MA Yi-zhun (1) GOU Jie (1) YAO Cun-feng (1) XIE Er-qin (2) (1) Institute of Modern Physics,Chinese Academy of Sciences,Lanzhou 730000,China (2) School of Physical Science and Technology,Lanzhou University,Lanzhou 730000,China

【机构】 中科院近代物理研究所； 兰州大学物理科学与技术学院；

【摘要】 利用320KV高压综合实验平台,对Eu掺杂的MgO单晶进行6MeV能量Xe离子辐照研究其光致发光现象,可看到Eu掺杂后发光强度较MgO有明显增强,经6MeV的Xe辐照后,在较低剂量条件下,380nm-550nm的发光带出现先减弱后又增强现象,随着剂量增加到5x1015ions/cm2,在400-450nm处出现了较强的蓝色发光带,发光强度明显增强,发光性能更加稳定,出现了平坦较宽的蓝光发射带,并通过红外光谱和拉曼光谱的分析对其发光现象进行了一定的解释。更多还原

【Abstract】 Eu Doped MgO single crystals irradiated with 6 MeV Xe ions using 320 KV high voltage Experimental platform were investigated by fluorescence spectroscopes.The PL spectra were obtained using 340 nm excitation light.PL intensity of Eu doped MgO become stronger compared with MgO.PL peaks located at 380-550 nm were decreased in PL spectra of Eu doped MgO irradiated with small fluence,the intensity of emission band become strong when irradiation fluence increasing up to 5x10 15 ions/cm 2.Those photoluminescence phenomena were explained by Fourier transform infrared spectra and Raman spectra.更多还原