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弱信号传感器可变增益放大读出电路设计
Weak signal CMOS readout circuit with variable gain amplifier
【Author】 Xu Bing~1 Guo Fangmin~1 Bian Hongyu~2 (1.East China Normal University,Laboratory of Polar Materials and Devices,Shanghai,20024,China; 2.College of Underwater Acoustic Engineering,Haerbin Engineering University,Harbin,150001,China)
【机构】 华东师范大学信息科学与技术学院教育部极化材料与器件实验室; 哈尔滨工程大学水声工程学院;
【摘要】 根据增益可调和低失真声纳弱信号传感器的读出要求,采用伪指数电压函数发生电路设计了一种0.5μm CMOS工艺可变增益放大器(VGA)读出电路。该模拟前端电路相对传统声纳读出电路具有低噪声、高线性度、高工作频率和增益连续可调功能。芯片工作电压5V条件下,每个电路通道功耗6mW,当增益小于50dB时,-3dB带宽为15MHz~39MHz,输入等效噪声5nV/Hz1/2@1.5MHz,14dB信噪比条件下的接收灵敏度为50μV,二次谐波失真低于-40dB。
【Abstract】 The CMOS weak signal readout circuit with variable gain amplifier(VGA) that adopts an approximated exponential equation is presented by 0.5μm CMOS technology.The front-end circuit had shown a 52dB gain variation range and power dissipation was 6mW at 5V.The input equivalent noise was 5nV/Hz1/2@1.5MHz,and the -3dB bandwidth with 15MHz 39MHz. The receiving sensitivity was 50μV at 14dB SNR.The 2nd order harmonic distortion(HD2) was lower than -40dBc.
【Key words】 Variable Gain Amplifier(VGA); weak signal; analogue front-end; CMOS readout circuit; harmonic distortion;
- 【会议录名称】 第九届全国信息获取与处理学术会议论文集Ⅱ
- 【会议名称】第九届全国信息获取与处理学术会议
- 【会议时间】2011-08-06
- 【会议地点】中国辽宁沈阳
- 【分类号】TP212;TN722
- 【主办单位】中国仪器仪表学会