【作者】 韩冰； 阳辉； 潘长勇；

【Author】 Han Bing Yang Hui Pan Changyong (Tsinghua National Laboratory for Information Science and Technology State Key Laboratory of Microwave and Digital Communication Department of Electronic Engineering,Tsinghua University,Beijing 100084,China)

【机构】 清华信息科学与技术国家实验室微波与数字通信技术国家重点实验室清华大学电子工程系；

【摘要】 本文提出一种OFDM调制器的测量模型,该模型可有效地描述OFDM调制器测量系统普遍存在的弱频率选择性,进而在消除弱频率选择性的基础上得到更精确的测量结果。同时针对该模型提出一种测量方法,利用低峰谷比序列作为待测传输序列,从而在测量端可有效消除测量系统弱频率选择性。根据该模型,本文提出将弱频率选择性作为OFDM调制器的一项测量参数,从而更全面地反映OFDM调制器的性能。实际测量表明,本文提出的测量模型和方法可以精确地评估OFDM调制器的性能。更多还原

【Abstract】 In this paper,the measurement model of the OFDM modulator is developed to include the widely existed weak frequency selectivity(WFS) in the measurement system of the OFDM modulator.The measurement precision can be greatly improved if the WFS can be cancelled or suppressed.Furthermore,this paper proposed the corresponding measurement method employing the Low Peak-to-Volley Ratio(LPVR) sequences as the transmitted data for the measurement and the WFS can be effectively estimated and suppressed.Based on proposed model,we suggest using weak frequency selectivity as the measurement parameter of the OFDM modulator to reflect its performance more precisely.The measurement results demonstrate the effectiveness of the WFS model and LPVR method to achieve better evaluation of the OFDM modulator.更多还原