【作者】 刘江峰； 包良满； 李晓林； 张桂林； 李燕；

【Author】 LIU Jiangfeng1, ,BAO Liangman2 ,LI Xiaolin2, ZHANG Guilin2 ,LI Yan2 (1: Xinyang Normal University, Xinyang, Henan, China, 464000) (2: Shanghai Institute of Applied Physics, the Chinese Academy of Sciences, Shanghai, China, 201800)

【机构】 信阳师范学院； 中科院上海应用物理研究所；

【摘要】 介绍了扫描质子微探针进行二维元素分布分析过程中的样品自吸收矫正方法。在微束PIXE分析的同时进行扫描透射离子显微成像探测获取样品的质量分布,通过我们建立的专用吸收矫正程序,对由于激发质子能量随入射深度的变化以及出射X射线被样品自吸收造成的衰减因素进行了矫正。为验证该方法的有效性,对电场燃煤炉排放的球型颗粒进行了分析测试,由于探测器位置和样品质量分布因素造成的Ca元素分布偏差得到了矫正。更多还原

【Abstract】 The purpose of this study is to correct yields of characteristic X-ray in micro-PIXE analysis by using scanning transmission ion microscopy (STIM) and computer calculation. We developed a computer calculation code to compensate the reduction of X-ray yields due to the thickness variation of a sample. We used STIM to investigate the thickness distribution of the sample. To confirm the validity of the code, spherical particle derived from coal burning power plant emissions, was used in this work as a test sample to be analyzed by micro-PIXE and STIM at the same time. Errors in the distributions of calcium in the spherical particle obtained by micro-PIXE analysis could be corrected according to the thickness distribution obtained by STIM to some extent by using our code.更多还原