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由Pb过量引起的空间电荷对PLT铁电薄膜电性能的影响
Effect of Space Charges Caused by Excess PbO on Electric Properties of PLT Ferroeleectric Thin Films
【Author】 Song Zhitang Ren Wei Zhang Liangying Yao Xi (Electronic Materials Research Laboratory,Xi’an Jiaotong University,Xi’an 710049,China)
【机构】 西安交通大学电子材料与器件研究所;
【摘要】 采用金属有机热分解方法制备了Pb过量的镧钛酸铅(PLT)铁电薄膜。电子探针和俄歇电子能谱证实了过量Pb存在于PLT薄膜中和界面上。薄膜的I(t)曲线研究表明,Pb过量的PLT薄膜中存在有陷阱电荷。过量Pb引起的成分偏析与结构缺陷造成了在薄膜的禁带之间产生了许多从能带中分离出的电子能级,其中在靠近薄膜禁带中心附近的深能级上可俘获自由载流子而形成陷阱电荷。在退极化场的作用下,在畴壁上可聚集自由电荷和陷阱电荷,陷阱电荷对电畴产生钉扎,使得薄膜的电滞回线和C-V曲线出现了异常的束腰和四峰现象,自由电荷可屏蔽内部的退极化电场,从而减小了电畴重新定向的障碍,减轻了陷阱电荷对电畴的钉扎程度。薄膜经短路升温处理后,由畴壁上自由电荷和陷阱电荷的变化导致了电滞回线和C-V曲线的异常程度的变化。
【Abstract】 An electron probe and an Auger electron spectroscopy were used to analyze the composition of lead lanthanum titanate thin films with excess PbO incorporated prepared by metallo-organic decomposition process.The analysis results show that excess Pb exists in PLT thin film and interface between thin film and bottom electrode.Time t dependence of DC currentⅠ(Ⅰ-t curves) of PLT thin films with excess Pb indicated that there are free charges and trapped charges in the thin films.Both structural and chemical disorders caused by excess Pb create highly localized electronic states in the forbidden gap.These states in middle forbidden gap can capture charge carries which becone trapped charges.A part of the free charges and trapped charges may be accumulated at domain walls under a depolarization field.The trapped charges act as pinning centers and have a strong effect on ferroelectric domains.The abbnormal electric properties such as pinched P-E hysteresis loops and four-peak C-V curves are observed.The free charges can reduce an electrostatic barrier to re-orientation of the domains by screening internal depolarizing fields and enhance the kinetics of domain re-orientation. This reduces the pinning effect caused by tuapped charges.The free charges and trapped charges at domain walls change after heating treatment in the condition of short circuit.This results in change of abnormal level of electric properties.
【Key words】 ferroelectric thin solid films; trapped charge; pinning; hysteresis loop; C-V curves;
- 【会议录名称】 第三届中国功能材料及其应用学术会议论文集
- 【会议名称】第三届中国功能材料及其应用学术会议
- 【会议时间】1998-10-13
- 【会议地点】中国重庆
- 【分类号】O484.42
- 【主办单位】中国仪器仪表学会仪表材料分会、中国金属学会功能材料分会、中国化学会、中国物理学会发光分科学会、机械工业部重庆仪表材料研究所、北京有色金属研究总院、清华大学、中国科技大学、南京大学、吉林大学、东北大学、北京科技大学、天津大学、重庆大学、四川联合大学、电子科技大学、福州大学、北京航空航天大学、湖南大学、大连理工大学、华中理工大学、北京工业大学、合肥工业大学、《功能材料》编辑部、重庆市科学技术委员会