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基于叉指电容型缺陷地结构(IDCS-DGS)微带传感器的聚合物材料老化表征新方法

A New Method for Characterizing the Aging of Polymer Insulating Materials Based on Interdigital-Capacitor-Shaped Defected Ground Structure(IDCS-DGS)Microstrip Sensor

【作者】 张炜;

【导师】 肖谧; 孙书成;

【作者基本信息】 天津大学 , 能源动力, 2023, 硕士

【摘要】 近年来,聚合物材料被广泛应用在高压线缆绝缘部分,对保障电缆安全运行起到重要作用。但由于电缆运行环境复杂,并且聚合物材料长期工作在高压的条件下,材料受环境中湿、热、电等因素影响,易发生热老化、湿热老化以及产生电树枝缺陷。这些可能引起材料绝缘性能下降的因素成为了威胁电缆安全运行主要原因,因此对于聚合物湿热老化及电树枝缺陷的研究具有十分重要的意义。由于高压绝缘技术的快速发展、不同工艺不同类型的绝缘材料大量投入使用,常见的一些表征方法局限性较大,并且国内关于微带传感器表征老化程度的研究较少,所以本文出了一种基于微带传感器的聚合物材料老化及电树枝缺陷表征新方法,具有重大意义。首先,本文使用高频电磁仿真软件设计仿真了叉指电容型缺陷地结构(IDCS-DGS)传感器,并分析了该传感器对于含有内部缺陷样品无损检测的能力,以及对老化带来的样品介电常数的改变的无损检测能力。证明了微带传感器进行湿热老化,电树枝缺陷检测的可能。最后制备样品并进行测试实验,用上述传感器测试,成功对湿热老化样品、电树枝样品进行了表征。在探究湿热老化样品的表征效果时,实验表明随着样品的老化时间增长,谐振频率的偏移量也增大。且湿热老化后样品谐振频率的偏移大于热老化后样品。说明IDCS-DGS微波传感器对于样品湿热老化程度的检测效果要好于热老化程度的检测效果。在探究含电树枝缺陷样品的表征效果时,IDCS-DGS微带传感器对停滞型电树枝在占空比较大时有很好的表征效果,对于混合型电树枝也可以通过频率偏移量判断电树枝占空比的变化趋势。本文通过仿真和实验测试分析,验证了出的聚合物材料老化表征新方法的有效性,为今后关于聚合物材料老化程度表征的研究打下了基础,供了新的思路。

【Abstract】 In recent years,polymer materials have been widely used in the insulation part of high-voltage cables,which plays a major role in ensuring the safe operation of cables.However,due to the complex operating environment of the cable and the long-term work of the polymer material under high pressure conditions,the thermal aging,hygrothermal aging and electrical tree defects of the polymer have become the main reasons for threatening the safe operation of the cable.Therefore,it is of great significance to study the polymer aging and electrical tree defects.Due to the rapid development of high-voltage insulation technology and the large-scale use of different types of insulation materials in different processes,some common characterization methods have great limitations,and there are few studies on the aging degree of microstrip resonators in China.Therefore,this paper proposes a new method for characterizing the aging and electrical tree defects of epoxy resin insulation materials based on microstrip resonators,which is of great significance.Firstly,this paper uses high-frequency electromagnetic simulation software to design and simulate the interdigital capacitive defected ground structure(IDCS-DGS)resonator,and analyzes the ability of the resonator for non-destructive testing of samples containing internal defects,as well as the ability of non-destructive testing of dielectric constant changes caused by aging.It is proved that it is possible to detect electrical tree defects by hygrothermal aging of microstrip resonators.Finally,the samples were prepared and tested.The hygrothermal aging samples and electrical tree samples were successfully characterized by the above sensor test,and the advantages and disadvantages of different types of microstrip resonators were discussed.In this paper,the effectiveness of the proposed new method for characterizing the aging of insulating materials is verified by simulation and experimental test analysis,which lays a foundation and provides a new idea for the future research on the characterization of the aging degree of insulating materials.

  • 【网络出版投稿人】 天津大学
  • 【网络出版年期】2026年 02期
  • 【分类号】TM247
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