【作者】 吴传贵；

【导师】 巩华荣； 李勇；

【作者基本信息】 电子科技大学 ， 软件工程（专业学位）， 2014， 硕士

【摘要】 本文围绕工厂下达的《通用自动测试系统研制》科研项目开展了自检子系统设计和实现研究。随着新装备的研制和投入使用的步伐加快,需要研制一套能够检测多种新型电子设备的通用自动测试系统。由于通用自动测试系统结构复杂,测试资源较多,传统人工自检时间长、劳动量大及易出错。为此,针对通用自动测试系统本身的自检问题,为确保对自动测试系统的自动检查与测试,需要设计和开发一套适应于该系统的自检子系统。本文以通用自动测试系统自检子系统的设计与实现为研究课题,重点以基于PXI总线的通用自动测试系统为研究对象,并将该系统作为一种特殊的UUT(Unit Under Test)。利用虚拟仪器可以较好的解决测试仪器的模块化、集成化和自动化的优点,本文在深入熟悉和研究了虚拟仪器的思想、发展、虚拟仪器的软硬件架构及特点、开发环境以及PXI总线规范仪器后,充分研究和理解了通用自动测试系统各种仪器模块和设备的硬件功能接口和控制函数后,分析了自动测试系统的自检方法,选用了LabWindows/CVI软件开发平台,进行了自检子系统的软硬件的设计开发。本课题的主要成果为:一是设计开发的一套ITA-ATE自检适配器;二是设计编制的一款TPS-ATE自检子系统测试程序。自检适配器主要功能模块有:ITA(Interface Test Adapter)接口子系统、电源模块、三用表模块、数字I/O模块及专用的测试连接电路。软件开发的主要功能模块有:主程序模块、初始化模块、手动测试模块、自动测试模块和NI7854R测试模块。论文针对自检子系统自动化、智能性的要求,开展了自检测方法的研究工作,提出了一种综合简捷自检方法。该方法是充分利用仪器自检、重点关注重要关键仪器测试、灵活运用开关及多路复用器,简化设计自检适配器的电路模块,强调软件就是仪器,开发专用的自检子系统测试程序。利用开发的自检适配器和自检子系统测试程序,对软硬件功能进行了试验验证。测试验证结果表明,该自检子系统实现完成了对通用自动测试系统的快速、准确的自检测试功能,为快速定位故障模块提供了检测手段,为确保系统投入电子设备测试前的完整性创造了技术条件。更多还原

【Abstract】 This thesis launches a self-test subsystem design and implementation of research around the research project "Universal Automatic Test System" issued by the factory. With the development of operating equipment and procedures, we need to develop a set of general-purpose automatic test system that can detect a variety of new electronic devices. Due to the complexity of general automatic test system structure, a lot of test resources, long-time of traditional artificial self-test, large amount of labor and error-prone. Therefore, for the questions of universal automatic test system of self-inspection itself, in order to ensure the automatic testing system of automatic inspection and testing, we need to design and develop a self-test subsystem adapted to the system.In this thesis, the design and implementation of universal automatic test system self-test subsystem for the research project, focusing on a generic automatic test system based on PXI bus for the study, and the system is used as a special UUT. Virtual instrument can better solve the advantages of modularization, integration and automation of testing instruments,After deeply research and familiar with the idea and development of the virtual instrument, hardware, software architecture and features of the virtual instrument, development environment and PXI bus specification instrument, the thesis fully studies and understands the universal automatic test system for all kinds of instrument module and the hardware equipment function interface and control function, analyze the self-test method of automatic test system, chooses the LabWindows / CVI software development platform for the hardware and software design and development of the self-test subsystem. The main achievements of this study are as follows: first, the design and development of ITA-ATE self-test adapter; second, the design of a TPS- ATE self-test subsystem test program. Self-test adapter main function modules: ITA interface subsystem, power modules, three tables module, digital I/O modules and dedicated test connection circuit. The main function modules of software development : the main program module initialization module, manual testing modules, automatic test module and NI7854 R test module.Aiming at the requirements of self-test subsystem automation and intelligence, the thesis carries out research work of detection methods, proposes a comprehensive simple self-test methods. The method is to make full use of the instrument self-checking, focus on the important key equipment testing, flexible use of the switch and the multiplexer, simplify the circuit module design self-test adapter, stress that software is instrument, develop a dedicated bit subsystem testing program. Use the development of self-test and self-test adapter subsystem test program to test and verify the software and hardware functions.Validation test results show that the self-test subsystem accomplishes the fast and accurate self-test function of universal automatic test system, provides detection means to quickly locate the faulty module, creates technical conditions to ensure the integrity of electronic devices into the system before the test.更多还原