针对混合信号测试的高效ATE测试解决方法的研究与实现

【作者】 熊炜；

【导师】 郭炜； 李帆；

【作者基本信息】 上海交通大学 ， 软件工程， 2008， 硕士

【摘要】 随着半导体技术的不断发展和国内消费电子市场的不断成熟,混合信号类器件市场竞争越来越激烈,控制器件的生产成本成为了取胜重要因素。而测试成本往往占据了器件生产成本的很大比例。高效的ATE测试方案可以缩短测试时间,降低测试成本,提高测试质量,真实反映器件测试结果。为控制器件生产成本提供显著贡献。混合信号类器件测试一般有测试时间长,并行效率低,模拟信号易受干扰,测试不稳等问题。本论文在对传统混合信号类器件测试方案的分析基础上,提出了新的测试方案,并将其应用于一款混合信号器件的测试中。新的测试方案充分结合了J750自动测试设备的特点,通过以下两个方面改进传统测试方案。一、测试程序优化:利用VBT将多项测试同步测试,更新了传统的PLL和数模转换器测试方式,减少了测试时间,提高了测试稳定性;二、硬件测试板设计:通过机械手等外围硬件配合,突破传统多点测试的设计,测试产能实现倍增。本论文从测试时间和成本上证明了新的测试方案可以有效改变混合信号类器件测试时间长、效率低的现象。从实际应用角度上,可为其它混合信号类器件测试提供借鉴,具有很高的实用价值。更多还原

【Abstract】 As the semi-conductor technology developing continuously and the market grow towards mature every day, the competition within devices of similar functions becomes ever fierce. Inevitably the cost control becomes more and more important. Testing is a major cost among all costs, therefore high-efficient ATE test solutions, plays a very important role in winning the market.Mixed signal test is commonly known as a time-consuming, parallel-incompatibility and noise-sensitive. In this paper the author will introduce a new mixed signal test solution through a project called“Lion”based on J750 ATE platform。The author will show that how the traditional PLL test and DAC test is improved by J750 test solution and how much time is saved as per this new generation ATE, as well as the improvement on test stability. This paper will also cover related PCB design technique of this new multi-site mixed-signal test solution。This new solution can provide great help for similar test projects.更多还原