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Intel80C31辐射效应测试系统的设计与实现

Design & Realization of Testing System for Intel80C31 Radiation Effect

【作者】 吴记群

【导师】 马义德;

【作者基本信息】 兰州大学 , 电路与系统, 2007, 硕士

【摘要】 微处理器已被大量用于卫星上的各种控制系统中,成为其核心部件。由于宇宙空间中存在大量高能质子、重离子,它可使卫星上的CPU、存储器等超大规模集成电路发生单粒子效应、锁定或硬损伤,影响微处理器的正常工作,直接缩短卫星的工作寿命,为此,很有必要在地面上进行相应的模拟实验,针对易出现故障的部分,实现元器件级及整机电路的加固和容错。Intel80C31是航天器电子系统中的主要控制器件,由于空间辐射效应会导致其出现单粒子翻转(SEU)、单粒子锁定(SEL)等多种单粒子效应,基于此,本文针对80C31CPU在单粒子效应中引起的各种故障进行模拟研究,设计实现了一种Intel80C31空间辐射效应测试系统。Intel80C31空间辐射效应测试系统硬件由被测试芯片80C31CPU系统、监测控制CPU系统、上位监控计算机系统等部分组成。被测80C31CPU芯片外扩27C64组成单片最小系统,通过双端口RAM实现与监控CPU数据交换。监控CPU通过RS-422接口与上位计算机实现数据通信。由硬件电路实现对被测80C31电源电流的监控,通过对80C31CPU芯片电流的检测,断电保护有效解决了实验过程中对80C31CPU芯片的损坏问题。测试系统软件由三部分构成:被测80C31CPU芯片的测试程序;监控AT89C52的通信、数据交换、检测等程序;上位计算机的监控程序。本测试系统利用在激光单粒子效应模拟试验子系统上对Intel80C31芯片进行了多组单粒子方面的实验。该系统极大地方便了对Intel80C31辐射效应的研究的实验过程,是进行Intel80C31辐射效应研究的一个有效平台。通过该平台能够方便进行Intel80C31辐射效应相关实验、获取Intel80C31辐射效应研究所需原始数据资料,为实现元器件级及整机电路的加固和容错提供了重要依据。

【Abstract】 The microprocessor has already been used in great quantities of various satellite’s control system. It is called the core part. Because there are many high-energy protons and heavy-ions in the astrospace, they can make the super large scale integration of satellite like CPU,the memory take place single event effects, latchup or hard damage and directly shorten the satellite’s work life. Therefore, it’s very necessary to carry on the corresponding simulation experiments on the ground, aiming at the easily broken-down part, realize the reinforce and error-tolerance of components and the whole circuit.Intel80C31 is the main controller in the aerospace machine’s electronics system, which easily has the phenomenon of Single Event Upset (SEU), Single Event Latchup (SEL) , Single Event Burnout and Single Event Gate Rupture because of the space radiation effect.Aiming at the simulation research on 80C31 CPU’s damage brought on single event effects, the test system’s hardware includes tested chip 80C31 CPU system, monitor control CPU system, host monitor computer system etc. The tested 80C31 CPU and 27C64 constitute a minimum system, which realizes data exchange to the monitor CPU through a dual-port RAM. Monitor CPU carries out data communication between the host computer through a RS-422 port. The tested 80C31’s power current is monitored by hardware circuit. Test system’s software is formed of three parts: the tested 80C31 CPU’s test program; monitor AT89C52’s communication, data exchange, detection program; host computer’s monitor program.Making use of "the Intel80C31 radiation effect test system", many experiments about single event on Intel80C31 at the simulation test sub-system of laser single event effects have been done. Through checking 80C31 CPU’s chip current, cutting power protection solves the damage problem of 80C31 CPU chip in the experiment on 80C31. This system facilitates the experiment process of research on Intel80C31 radiation effect greatly. It is an effective platform of research on Intel80C31 radiation effect. In addition, the platform can easily carry through related experiments on Intel80C31 radiation effect, capture the original data in the process of Intel80C31 radiation effect research, provide important foundation for the reinforce and error-tolerance of components and the whole circuits.

  • 【网络出版投稿人】 兰州大学
  • 【网络出版年期】2007年 04期
  • 【分类号】V443
  • 【被引频次】2
  • 【下载频次】191
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