发光二极管关键测试技术研究与应用

【作者】 马春雷；

【导师】 鲍超；

【作者基本信息】 浙江大学 ， 测试计量技术及仪器， 2005， 硕士

【摘要】 本文针对光电器件产业快速发展对测试技术的需求，主要研究发光二极管LED(Light Emitted Diode)的关键测试技术和方法，包括高功率LED的热学特性参数和LED的光谱、光度参数的测试原理、方法、步骤及系统实现，涉及热学、光度学、色度学等多个专业领域。 从半导体器件的热学角度分析了高功率LED的热学模型和热学参数，提出高功率LED的动态电学测量方法、步骤以及测量的关键点，以高速数据采集卡为核心搭建了测量热阻和结温的测试系统，辅以恒温装置，可完成对高功率LED热学参数的测量，为进一步的设计改进奠定了基础。 对LED作为光源时主要的的光谱和光度参数进行了理论和算法分析，以NMOS线阵图像传感器为光谱探测器，以AT89C51为控制和数据采集核心，通过RS232串行通信PC机对原始数据进行处理，完成了LED光谱测试仪硬件和软件的设计与开发，该套仪器系统可完成LED光谱和光度参数的快速测量，适用于LED的生产测试和研究试验。 最后利用所开发的试验装置和仪器对样品进行了测试，给出了热学参数、光谱参数和色度等测试结果数据，分析了试验误差原因，并提出仪器的改进意见和方法。更多还原

【Abstract】 This paper will focus on research and application key test technology and method about light emitted diode as the rapid development of optoelectronic device demands the novel test technolog, including the principal, the method, the steps and the implement of test system of parameter testing, such as thermal performance parameters of high power LED and spectral and photometric parameters of LED.The thermal model, and parameters of high power LED are analyzed from the view of the thermal science of semiconductor, and the method, the steps and key factors of dynamic electrical measurement for high power LED are investigated. A measurement and control platform based on high-speed data acquisition card is founded with temperature-controlled equipment for testing the thermal resistance and the junction temperature of high power LED, which is the basis of the next design and improvement.The theory and the arithmetic for the measurement of spectral and photometric parameter of light emitted diode are analyzed. We design and develop the spectrum test instrument ,based on NMOS linear image sensor and AT89C51 of MCU. The PC makes the process of the raw data from MCU by RS232 serial port communication. The hardware and the software are designed to implement the test function. The spectrum test system can be used for the products test and the experiment of LED.The test data of the samples, the analysis of measurement uncertainty and the suggestions and methods of improvement are given.更多还原