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Characterization of large ferroelectric polarization and high-TC in sol–gel deposited PbTiO3-based perovskite thin films
【摘要】 BiMeO3–PbTiO3(where Me represents transition metals) perovskite-type thin films have been widely studied due to their superior ferroelectric properties, including robust ferroelectric polarization and high Curie temperatures. In this study, PbTiO3-based perovskite thin films of xBi(Cu1/2Zr1/2)O3–(1-x)PbTiO3(xBCZ–(1-x)PT) were designed and prepared on Pt(111)/Ti/SiO2/Si substrates using the conventional sol–gel method. The x BCZ–(1-x)PT thin films demonstrate remarkable crystallinity, characterized by a perovskite structure and a dense microstructure, which contribute to their highperformance ferroelectric and fatigue properties. Notably, the thin films exhibit large remnant polarization(2Pr) values,reaching 98 ??C·cm-2 and 74 ??C·cm-2 for the 0.05BCZ–0.95PT and 0.1BCZ–0.9PT compositions, respectively. Furthermore, the thin films also demonstrate a high Curie temperature(TC= 510℃), as well as favorable fatigue properties and low leakage current, suggesting their potential applicability in ferroelectric devices.
【Abstract】 BiMeO3–PbTiO3(where Me represents transition metals) perovskite-type thin films have been widely studied due to their superior ferroelectric properties, including robust ferroelectric polarization and high Curie temperatures. In this study, PbTiO3-based perovskite thin films of xBi(Cu1/2Zr1/2)O3–(1-x)PbTiO3(xBCZ–(1-x)PT) were designed and prepared on Pt(111)/Ti/SiO2/Si substrates using the conventional sol–gel method. The x BCZ–(1-x)PT thin films demonstrate remarkable crystallinity, characterized by a perovskite structure and a dense microstructure, which contribute to their highperformance ferroelectric and fatigue properties. Notably, the thin films exhibit large remnant polarization(2Pr) values,reaching 98 ??C·cm-2 and 74 ??C·cm-2 for the 0.05BCZ–0.95PT and 0.1BCZ–0.9PT compositions, respectively. Furthermore, the thin films also demonstrate a high Curie temperature(TC= 510℃), as well as favorable fatigue properties and low leakage current, suggesting their potential applicability in ferroelectric devices.
【Key words】 ferroelectric thin films; perovskite; sol–gel method; curie temperature;
- 【文献出处】 Chinese Physics B ,中国物理B , 编辑部邮箱 ,2026年02期
- 【分类号】O484
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