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高功率微波作用下微波混频器损伤效应的测试方法

Test Method for Quantifying High Power Microwave-Induced Damage in Microwave Mixers

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【作者】 杨志强章勇华巴涛涂敏李平

【Author】 YANG Zhiqiang;ZHANG Yonghua;BA Tao;TU Min;LI Ping;School of Mechano-Electronic Engineering,Xidian University;Key Laboratory of Advanced Science and Technology on High Power Microwave;

【机构】 西安电子科技大学机电工程学院先进高功率微波技术重点实验室

【摘要】 微波混频器是高端微波接收机射频前端的核心敏感器件,当其作为直接混频式前端接收方式“前门”第一级时,极易因高功率微波(high power microwave,HPM)辐射而受损。HPM对微波混频器的损伤敏感指标参数是变频损耗,主要损伤结果为变频损耗增大、接收链路增益和系统灵敏度降低,最终影响系统使用效能。本文将变频损耗与相位差作为微波混频器HPM损伤效应的主要评估指标,并提出了基于相同中频信号幅度下射频信号功率比的微波混频器HPM损伤效应测试评估方法,为非线性器件HPM损伤效应研究提供了规范化技术途径。

【Abstract】 Microwave mixers are critical and sensitive devices in the RF front-end of high-performance microwave receivers. When employed as the first stage of “front door” of direct-conversion architectures,they are highly impaired by high-power microwave radiation. The main damage result of microwave mixers to HPM is conversion loss, which will lead to the decrease of receiving link gain and system sensitivity, and finally to the decrease of system performance. It is clear that conversion loss and phase difference are the main evaluation indexes of HPM damage effects on microwave mixers. In this paper, the test method for HPM damage effects on microwave mixers is proposed. Specifically, it is determined that the ratio of RF power to the HPM damage effects on microwave mixers should be characterized by the same IF signal amplitude. This method is of great significance to the research of HPM damage effects on microwave mixers and other nonlinear devices.

【基金】 先进高功率微波技术重点实验室基金资助项目(Z091230819)
  • 【文献出处】 现代应用物理 ,Modern Applied Physics , 编辑部邮箱 ,2026年01期
  • 【分类号】TN773
  • 【下载频次】30
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