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Topological Corner States due to Boundary Defects

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【作者】 张贻齐胡玉伟李永东尚策

【Author】 Yiqi Zhang;Yuwei Hu;Yongdong Li;Ce Shang;Key Laboratory for Physical Electronics and Devices, Ministry of Education, School of Electronic Science and Engineering, Xi’an Jiaotong University;Aerospace Information Research Institute, Chinese Academy of Sciences;College of Precision Instrument and Optoelectronics Engineering, Tianjin University;

【通讯作者】 张贻齐;尚策;

【机构】 Key Laboratory for Physical Electronics and Devices, Ministry of Education, School of Electronic Science and Engineering, Xi’an Jiaotong UniversityAerospace Information Research Institute, Chinese Academy of SciencesCollege of Precision Instrument and Optoelectronics Engineering, Tianjin University

【摘要】 <正>In conventional higher-order topological insulators (HOTIs),the emergence of topological states can be explained by using the nonzero bulk polarization index.However,corner states emerge in HOTIs with incomplete boundary unit cells (i.e.,boundary defects) even though the bulk polarization is zero,which challenges the conventional understanding of HOTIs.

【关键词】 topologicalCornercornerincompletedefectsexplainednonzeroemergenceemergechallenges
【基金】 supported by the Natural Science Basic Research Program of Shaanxi Province (Grant Nos. 2024JC-JCQN-06 and2025JC-QYCX-006);the National Natural Science Foundation of China (Grant No. 12474337);Chinese Academy of Sciences Project (Grant Nos. E4BA270100,E4Z127010F, E4Z6270100, and E53327020D)
  • 【文献出处】 Chinese Physics Letters ,中国物理快报(英文版) , 编辑部邮箱 ,2026年01期
  • 【分类号】O469
  • 【下载频次】1
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